Transmission Electron Microscopes (TEM)
| JEOL 2011 | JEOL 1400 | Hitachi H7000 |
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| High resolution TEM with EDX (200kV) | Conventional TEM (120 kV) | Conventional TEM (80kV) |
Sample preparation equipment for TEM
| Saw | Planar polishing | Dimple polishing |
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| Ion polishing | Ultramicroto | Cryo ultramicrotom |
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| AFS | Cryo plunging Leica | Glow dicharge |
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